EDX8000T Plus plating thickness measuring device

EDX8000T Plus plating thickness measuring device

EDX8000T Plus plating thickness measuring device

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Specifications
Instrument size: 520mm * 400mm * 450mm
Sample chamber size: 430mm * 370mm * 210mm
Weight: 35Kg
Element scope: Mg12-U92
Content scope: 1ppm- 99.99%
LOD: 0.005μm, up to five layers
Detector: High Resolution Peltier Cooled SDD Detector (FSDD Optinal)
DPP analyzer: channels
X-ray tube: 50W micro focusing tube
Measure direction: From the bottom up
collimator tube: Automatically select φ{0}}.15mm,φ0.2mm,φ0.3mm,Option 0.1*0.2mm
X-ray generator: 0-50KV
Power supply: 220ACV 50% 2f60HZ
The sample platform has high precision

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